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WM-EDX-B3 Si-PIN Benchtop XRF Analyzer for Precious Metals
Original price was: $16,500.00.$11,000.00Current price is: $11,000.00.
The entry configuration in the WM-EDX-B series, using a Si-PIN detector for benchtop precious-metal and alloy analysis.
- Model: WM-EDX-B3
- Best fit: Jewelry and precious-metal intake checks; Alloy and recycling material screening
- Freight: quoted by destination address; customer-appointed forwarders supported.
WM-EDX-B3: Buyer Summary
The entry configuration in the WM-EDX-B series, using a Si-PIN detector for benchtop precious-metal and alloy analysis.
Choose B3 when a Si-PIN detector and the listed 2 ppm–99.99% content range fit the project. Compare B6 or B9 when lower listed concentration ranges and SDD response are required.
Who This Model Is For
Typical Applications
- Jewelry and precious-metal intake checks
- Alloy and recycling material screening
- Bench-based quality control
- Buyers comparing Si-PIN and SDD configurations
Before You Order
Send sample photos, expected composition range, daily test volume, reporting needs, destination, voltage and preferred shipping route. We will confirm the configuration in writing before payment.
Verified Technical Specifications
Values above come from the current product record. Performance depends on the selected configuration, element, sample matrix, surface condition, calibration and test method. Confirm critical requirements with your samples before ordering.
Testing Workflow and Practical Limits
Recommended Workflow
- Identify the sample and clean the test area.
- Use a flat, representative test point where possible.
- Run repeat tests when shape, plating or surface condition may affect the result.
- Save the spectrum or report with the transaction record.
Important Limit
Benchtop XRF is a non-destructive surface analysis method. Plated, hollow, irregular or non-homogeneous items may require several test points or a complementary method before a final purchase or settlement decision.
Configuration, Packing and Global Delivery
We confirm detector, software, accessories, voltage, language, current machine photos and packing details before shipment. Freight is calculated by destination address, route, quantity, fuel cost and shipping method. Customer-appointed freight forwarders are supported.
Compare Related XRF Analyzers
Frequently Asked Questions
Can WM-EDX-B3 test jewelry without damage?
The listed workflow uses non-destructive XRF analysis. Surface condition, plating, geometry and sample homogeneity still affect interpretation.
What should I send for a quotation?
Send sample type, photos, expected composition range, daily test volume, destination address, voltage and any reporting or software requirements.
Can I use my own freight forwarder?
Yes. We can deliver to a customer-appointed forwarder after confirming the receiving address and packing details.
Request a WM-EDX-B3 Configuration and Quote
Tell us what you test and where the machine will be delivered. We will confirm model fit, technical configuration, current price and freight before quotation.
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